Browsing by Subject "Integrated circuit testing"
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Article
Aliasing probability calculations for arbitrary compaction under independently selected random test vectors
(2005)This paper discusses a systematic methodology for calculating the exact aliasing probability associated with schemes that use an arbitrary finite-state machine to compact the response of a combinational circuit to a sequence ...
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Article
Stochastic testing of finite state machines
(2001)This paper discusses an approach that uses statistical observations about the steady-state behavior of a finite state machine (FSM) in order to detect and identify permanent failures in its state transition mechanism. The ...