Application of an analytical model based on transistor concepts for the characterization of potential-induced degradation in crystalline silicon photovoltaics

dc.contributor.author	Kindyni, N.	en
dc.contributor.author	Georghiou, George E.	en
dc.creator	Kindyni, N.	en
dc.creator	Georghiou, George E.	en
dc.date.accessioned	2019-04-08T07:46:30Z
dc.date.available	2019-04-08T07:46:30Z
dc.date.issued	2013
dc.identifier.uri	http://gnosis.library.ucy.ac.cy/handle/7/43815
dc.source	Conference Record of the IEEE Photovoltaic Specialists Conference	en
dc.source	Conference Record of the IEEE Photovoltaic Specialists Conference	en
dc.source.uri	https://www.scopus.com/inward/record.uri?eid=2-s2.0-84896450395&doi=10.1109%2fPVSC.2013.6744443&partnerID=40&md5=63a04fe769857031af33c996eba4f44b
dc.title	Application of an analytical model based on transistor concepts for the characterization of potential-induced degradation in crystalline silicon photovoltaics	en
dc.type	info:eu-repo/semantics/conferenceObject
dc.identifier.doi	10.1109/PVSC.2013.6744443
dc.description.startingpage	1559
dc.description.endingpage	1565
dc.author.faculty	Πολυτεχνική Σχολή / Faculty of Engineering
dc.author.department	Τμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering
dc.type.uhtype	Conference Object	en
dc.contributor.orcid	Georghiou, George E. [0000-0002-5872-5851]
dc.gnosis.orcid	0000-0002-5872-5851

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