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Functions for quality transition-fault tests and their applications in test-set enhancement

dc.contributor.authorNeophytou, S. N.en
dc.contributor.authorMichael, Maria K.en
dc.contributor.authorTragoudas, S.en
dc.creatorNeophytou, S. N.en
dc.creatorMichael, Maria K.en
dc.creatorTragoudas, S.en
dc.date.accessioned2019-04-08T07:47:23Z
dc.date.available2019-04-08T07:47:23Z
dc.date.issued2006
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/44338
dc.sourceIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systemsen
dc.source.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-33845668440&doi=10.1109%2fTCAD.2006.882635&partnerID=40&md5=5f8abddc3b354efdbb42e36cfbca6fea
dc.titleFunctions for quality transition-fault tests and their applications in test-set enhancementen
dc.typeinfo:eu-repo/semantics/article
dc.identifier.doi10.1109/TCAD.2006.882635
dc.description.volume25
dc.description.issue12
dc.description.startingpage3026
dc.description.endingpage3035
dc.author.facultyΠολυτεχνική Σχολή / Faculty of Engineering
dc.author.departmentΤμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering
dc.type.uhtypeArticleen
dc.source.abbreviationIEEE Trans Comput Aided Des Integr Circuits Systen
dc.contributor.orcidMichael, Maria K. [0000-0002-1943-6547]
dc.gnosis.orcid0000-0002-1943-6547


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