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dc.contributor.authorStudenmund, W. R.en
dc.contributor.authorFishman, I. M.en
dc.contributor.authorKino, G. S.en
dc.contributor.authorGiapintzakis, Johnen
dc.creatorStudenmund, W. R.en
dc.creatorFishman, I. M.en
dc.creatorKino, G. S.en
dc.creatorGiapintzakis, Johnen
dc.date.accessioned2019-05-06T12:24:38Z
dc.date.available2019-05-06T12:24:38Z
dc.date.issued1997
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/48844
dc.description.abstractWe present a technique to experimentally determine the value of the temperature perturbation ST in photothermal microscopy. Knowledge of δT is necessary for proper analysis of the differential optical reflectivity (∂R/∂T) data obtained from untwinned Y1Ba2Cu3O7 crystals. We measure δT to be 0.2 K, consistent with previous theoretical predictions from thermal diffusion data. © 1997 American Institute of Physics.en
dc.language.isoengen
dc.sourceApplied Physics Lettersen
dc.subjectCalculationsen
dc.subjectSpurious signal noiseen
dc.subjectOptical microscopyen
dc.subjectThermal conductivityen
dc.subjectHigh temperature superconductorsen
dc.subjectYttrium compoundsen
dc.subjectYttrium barium copper oxideen
dc.subjectTemperature measurementen
dc.subjectPhotothermal microscopyen
dc.subjectLight reflectionen
dc.subjectReflectivityen
dc.subjectTaylor series expansionen
dc.subjectTemperature perturbationen
dc.subjectThermal diffusionen
dc.titleExperimental determination of the absolute temperature modulation in photothermal microscopy of Y1Ba2Cu3O7 crystalsen
dc.typeinfo:eu-repo/semantics/article
dc.identifier.doi10.1063/1.118255
dc.description.volume70
dc.description.startingpage773
dc.description.endingpage775
dc.author.facultyΠολυτεχνική Σχολή / Faculty of Engineering
dc.author.departmentΤμήμα Μηχανικών Μηχανολογίας και Κατασκευαστικής / Department of Mechanical and Manufacturing Engineering
dc.type.uhtypeArticleen
dc.contributor.orcidGiapintzakis, John [0000-0002-7277-2662]
dc.description.totalnumpages773-775
dc.gnosis.orcid0000-0002-7277-2662


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