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dc.contributor.authorZervos, Matthewen
dc.contributor.authorMihailescu, C. N.en
dc.contributor.authorGiapintzakis, Johnen
dc.contributor.authorOthonos, A.en
dc.contributor.authorTravlos, A.en
dc.contributor.authorLuculescu, C. R.en
dc.creatorZervos, Matthewen
dc.creatorMihailescu, C. N.en
dc.creatorGiapintzakis, Johnen
dc.creatorOthonos, A.en
dc.creatorTravlos, A.en
dc.creatorLuculescu, C. R.en
dc.date.accessioned2019-05-06T12:24:53Z
dc.date.available2019-05-06T12:24:53Z
dc.date.issued2015
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/48969
dc.description.abstractSn-doped In2O3 nanowires have been grown on Si via the vapor-liquid-solid mechanism at 800 °C and then exposed to H2S between 300 to 600 °C. We observe the existence of cubic bixbyite In2O3 and hexagonal SnS2 after processing the Sn:In2O3 nanowires to H2S at 300 °C but also cubic bixbyite In2O3, which remains dominant, and the emergence of rhombohedral In2(SO4)3 at 400 °C. The resultant nanowires maintain their metallic-like conductivity, and exhibit photoluminescence at 3.4 eV corresponding to band edge emission from In2O3. In contrast, Sn:In2O3 nanowires grown on glass at 500 °C can be treated under H2S only below 200 °C which is important for the fabrication of Cu2S/Sn:In2O3 core-shell p-n junctions on low-cost transparent substrates such as glass suitable for quantum dot-sensitized solar cells. © 2015, Zervos et al.en
dc.language.isoengen
dc.sourceNanoscale Research Lettersen
dc.subjectOptical propertiesen
dc.subjectGlassen
dc.subjectNanowiresen
dc.subjectTinen
dc.subjectVapor-liquid-solid mechanismen
dc.subjectBand-edge emissionsen
dc.subjectSemiconductor quantum dotsen
dc.subjectP-n junctionen
dc.subjectSemiconductor junctionsen
dc.subjectExposed toen
dc.subjectTin oxidesen
dc.subjectCore shellen
dc.subjectIndium tin oxideen
dc.subjectQuantum dot-sensitized solar cellsen
dc.subjectSn-doped inen
dc.subjectSulfuren
dc.titleElectrical, structural, and optical properties of sulfurized Sn-doped In2O3 nanowiresen
dc.typeinfo:eu-repo/semantics/article
dc.identifier.doi10.1186/s11671-015-0995-z
dc.description.volume10
dc.author.facultyΠολυτεχνική Σχολή / Faculty of Engineering
dc.author.departmentΤμήμα Μηχανικών Μηχανολογίας και Κατασκευαστικής / Department of Mechanical and Manufacturing Engineering
dc.type.uhtypeArticleen
dc.contributor.orcidZervos, Matthew [0000-0002-6321-233X]
dc.contributor.orcidGiapintzakis, John [0000-0002-7277-2662]
dc.gnosis.orcid0000-0002-6321-233X
dc.gnosis.orcid0000-0002-7277-2662


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