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Accelerating diagnosis via dominance relations between sets of faults

dc.contributor.authorAdapa, R.en
dc.contributor.authorTragoudas, S.en
dc.contributor.authorMichael, Maria K.en
dc.creatorAdapa, R.en
dc.creatorTragoudas, S.en
dc.creatorMichael, Maria K.en
dc.date.accessioned2019-04-08T07:44:33Z
dc.date.available2019-04-08T07:44:33Z
dc.date.issued2007
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/42706
dc.sourceProceedings of the IEEE VLSI Test Symposiumen
dc.sourceProceedings of the IEEE VLSI Test Symposiumen
dc.source.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-37549032529&doi=10.1109%2fVTS.2007.10&partnerID=40&md5=f6060eb2b8038e7d317fa13fc54fad8f
dc.titleAccelerating diagnosis via dominance relations between sets of faultsen
dc.typeinfo:eu-repo/semantics/conferenceObject
dc.identifier.doi10.1109/VTS.2007.10
dc.description.startingpage219
dc.description.endingpage224
dc.author.facultyΠολυτεχνική Σχολή / Faculty of Engineering
dc.author.departmentΤμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering
dc.type.uhtypeConference Objecten
dc.contributor.orcidMichael, Maria K. [0000-0002-1943-6547]
dc.gnosis.orcid0000-0002-1943-6547


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