| dc.contributor.author | Khan, O. | en |
| dc.contributor.author | Michael, Maria K. | en |
| dc.contributor.author | Miele, A. | en |
| dc.contributor.author | Qiaoyan, Y. | en |
| dc.creator | Khan, O. | en |
| dc.creator | Michael, Maria K. | en |
| dc.creator | Miele, A. | en |
| dc.creator | Qiaoyan, Y. | en |
| dc.date.accessioned | 2019-04-08T07:46:28Z | |
| dc.date.available | 2019-04-08T07:46:28Z | |
| dc.date.issued | 2016 | |
| dc.identifier.uri | http://gnosis.library.ucy.ac.cy/handle/7/43799 | |
| dc.source | 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016 | en |
| dc.source.uri | https://www.scopus.com/inward/record.uri?eid=2-s2.0-84999277880&doi=10.1109%2fDFT.2016.7684056&partnerID=40&md5=17f5c8db56f167fe2df35bd917f6e57f | |
| dc.title | Foreword | en |
| dc.type | info:eu-repo/semantics/article | |
| dc.identifier.doi | 10.1109/DFT.2016.7684056 | |
| dc.description.issue | Journal Article | en |
| dc.author.faculty | Πολυτεχνική Σχολή / Faculty of Engineering | |
| dc.author.department | Τμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering | |
| dc.type.uhtype | Article | en |
| dc.source.abbreviation | IEEE Int.Symp.Defect Fault Toler.VLSI Nanotechnol.Syst., DFT | en |
| dc.contributor.orcid | Michael, Maria K. [0000-0002-1943-6547] | |
| dc.gnosis.orcid | 0000-0002-1943-6547 | |
