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dc.contributor.authorMichael, Maria K.en
dc.contributor.authorStratigopoulos, H. G.en
dc.creatorMichael, Maria K.en
dc.creatorStratigopoulos, H. G.en
dc.date.accessioned2019-04-08T07:47:11Z
dc.date.available2019-04-08T07:47:11Z
dc.date.issued2017
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/44219
dc.sourceIEEE Design and Testen
dc.source.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85028513744&doi=10.1109%2fMDAT.2017.2741460&partnerID=40&md5=d637702f21f5fb7f20ec429fc35b1354
dc.titleRecap of the European Test Symposium 2017 (ETS'17)en
dc.typeinfo:eu-repo/semantics/article
dc.identifier.doi10.1109/MDAT.2017.2741460
dc.description.volume34
dc.description.issue6
dc.description.startingpage119
dc.description.endingpage120
dc.author.facultyΠολυτεχνική Σχολή / Faculty of Engineering
dc.author.departmentΤμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering
dc.type.uhtypeArticleen
dc.source.abbreviationIEEE Des.Testen
dc.contributor.orcidMichael, Maria K. [0000-0002-1943-6547]
dc.gnosis.orcid0000-0002-1943-6547


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