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Efficient deterministic test generation for BIST schemes with LFSR reseeding

dc.contributor.authorNeophytou, S.en
dc.contributor.authorMichael, Maria K.en
dc.contributor.authorTragoudas, S.en
dc.creatorNeophytou, S.en
dc.creatorMichael, Maria K.en
dc.creatorTragoudas, S.en
dc.date.accessioned2019-04-08T07:47:22Z
dc.date.available2019-04-08T07:47:22Z
dc.date.issued2006
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/44331
dc.sourceProceedings - IOLTS 2006: 12th IEEE International On-Line Testing Symposiumen
dc.sourceProceedings - IOLTS 2006: 12th IEEE International On-Line Testing Symposiumen
dc.source.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-34247233243&doi=10.1109%2fIOLTS.2006.26&partnerID=40&md5=d9d246cfccb86fa64079bb864f1e98c9
dc.titleEfficient deterministic test generation for BIST schemes with LFSR reseedingen
dc.typeinfo:eu-repo/semantics/conferenceObject
dc.identifier.doi10.1109/IOLTS.2006.26
dc.description.volume2006
dc.description.startingpage43
dc.description.endingpage48
dc.author.facultyΠολυτεχνική Σχολή / Faculty of Engineering
dc.author.departmentΤμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering
dc.type.uhtypeConference Objecten
dc.contributor.orcidMichael, Maria K. [0000-0002-1943-6547]
dc.gnosis.orcid0000-0002-1943-6547


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