Test set Embedding in Accumulator-generated sequences targeting Hard-To-detect faults
Ημερομηνία
2013Συγγραφέας
Voyiatzis, I.Neophytou, S.
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Hadjitheophanous, S.
Sgouropoulou, C.
Efstathiou, C.
Source
IEEE Proc. of International Design and Test Symposium (IDT)Pages
1-2Google Scholar check