Toggle navigation
English
Ελληνικά
English
English
Ελληνικά
Login
Toggle navigation
View Item
Home
Δημοσιεύσεις ΠΚ / UCY Publications
002 Σχολή Θετικών και Εφαρμοσμένων Επιστημών / Faculty of Pure and Applied Sciences
Τμήμα Φυσικής / Department of Physics
View Item
Home
Δημοσιεύσεις ΠΚ / UCY Publications
002 Σχολή Θετικών και Εφαρμοσμένων Επιστημών / Faculty of Pure and Applied Sciences
Τμήμα Φυσικής / Department of Physics
View Item
JavaScript is disabled for your browser. Some features of this site may not work without it.
Article
Photothermal Reflectance Investigation of Implanted Silicon - the Influence of Thermal Annealing
Date
1995
Author
Seas, Antonios
Christofides, Constantinos
ISSN
0003-6951
Source
Applied Physics Letters
Volume
66
Issue
24
Pages
3346-3348
Google Scholar check
Keyword(s):
TEMPERATURE
ION-IMPLANTATION
OPTICAL REFLECTANCE
PROCESSED SILICON
DAMAGE
SEMICONDUCTORS
WAFERS
DEFECTS
LAYERS
Metadata
Show full item record
DOI
10.1063/1.113752
URI
http://gnosis.library.ucy.ac.cy/handle/7/59038
Collections
Τμήμα Φυσικής / Department of Physics
[1410]
Cite as
APA
Vancouver
Harvard
BibTeX
Search Gnosis
This Collection
Browse
Everywhere
Communities & Collections
By Submission Date
Authors
Titles
Subjects
By Type
By Department
By Faculty
This Collection
By Submission Date
Authors
Titles
Subjects
By Type
By Department
By Faculty
My Account
Login
Statistics
View Usage Statistics