Browsing by Author "Aragón, J. L."
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Conference Object
An analytical model for the calculation of the Expected Miss Ratio in faulty caches
Sánchez, D.; Sazeides, Yiannakis; Aragón, J. L.; García, J. M. (2011)Technology scaling improvement is affecting the reliability of ICs due to increases in static and dynamic variations as well as wear-out failures. This is particularly true for caches that dominate the area of modern ...
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Article
Modeling the impact of permanent faults in caches
Sánchez, D.; Sazeides, Yiannakis; Cebrián, J. M.; Garćia, J. M.; Aragón, J. L. (2013)The traditional performance cost benefits we have enjoyed for decades from technology scaling are challenged by several critical constraints including reliability. Increases in static and dynamic variations are leading to ...