Browsing by Subject "Comprehensive studies"
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Article
Determination of critical points on silicon nanofilms: Surface and quantum confinement effects
(2008)In this work, we present a comprehensive study of the optical properties of nanocrystalline silicon films with thickness varied from 5 to 30 nm. Spectroscopic ellipsometry is employed to determine the dielectric functions ...
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Article
Ultrafast time-resolved spectroscopy of Si nanocrystals embedded in SiO2 matrix
(2009)In this work, we present a comprehensive study of ultrafast transient photoinduced absorption of silicon nanocrystals (NCs) embedded in SiO2 matrix. The samples under investigation are single monolayers of Si-NCs embedded ...