Browsing by Subject "Film thickness"
Now showing items 1-3 of 3
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Article
Measurement of liquid crystal film thickness using interferometry
(2010)Thickness measurements of thin films having thickness less than 1 µm are difficult to obtain by an interferometer. These difficulties arise from the overlap of the fringes from the upper and lower surfaces of the thin ...
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Article
Time-resolved ultrafast carrier dynamics in as-grown nanocrystalline silicon films: The effect of film thickness and grain boundaries
(2008)In this letter, we have studied transient photoinduced absorption in as-grown nanocrystallinc silicon films with thickness varied from 5 to 30 nm. Effects of quantum confinement (QC) in z-direction and grain boundary ...
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Article
Transient photoinduced absorption in ultrathin as-grown nanocrystalline silicon films
(2008)We have studied ultrafast carrier dynamics in nanocrystalline silicon films with thickness of a few nanometers where boundary-related states and quantum confinement play an important role. Transient non-degenerated ...