Browsing by Subject "Nondestructive examination"
Now showing items 1-6 of 6
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Article
Diagnostics of nonradiative defects in the bulk and surface of brewster-cut Ti:sapphire laser materials using photothermal radiometry
(1997)The understanding of the problem of nonradiative energy conversion in solid-state laser materials is a key factor in improving the overall efficiency of solid-state lasers. Furthermore, the reduction of the heat generated ...
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Article
Ellipsometric analysis of ion-implanted polycrystalline silicon films before and after annealing
(2006)A study of arsenic ion-implanted polycrystalline silicon films before and after annealing at various temperatures has been performed using spectroscopic ellipsometry in the ultraviolet to the visible spectral region. Using ...
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Article
Fine art painting characterization by spectroscopic ellipsometry: Preliminary measurements on varnish layers
(2004)The long-term conservation of the original state of paintings requires high quality multi-spectral digital image technologies. CRISATEL Program addresses fine art professionals as primary end-users base. The analysis by ...
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Article
Mechanical and tribological properties of hard aluminium-carbon multilayer films prepared by the Laser-Arc technique
(1998)The method of laser-induced vacuum arc (Laser-Arc) combines the good controllability of pulsed laser deposition with the high efficiency of a vacuum arc technique. One advantage of this technique is the reduction of droplets, ...
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Article
The method of fundamental solutions for three-dimensional inverse geometric elasticity problems
(2016)We investigate the numerical reconstruction of smooth star-shaped voids (rigid inclusions and cavities) which are compactly contained in a three-dimensional isotropic linear elastic medium from a single set of Cauchy data ...
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Article
Optical response of thin supported palladium films to hydrogen: Non-destructive testing for hydrogen detection
(1999)The properties of thin palladium films on silicon dioxide/silicon substrates are investigated. As the electrical properties of very thin palladium films cannot be measured, due to highly discontinuous nature of the films ...