• Article  

      Progress in photothermal microscopy of YBa2Cu3O7-x 

      Studenmund, W. R.; Fishman, I. M.; Kino, G. S.; Giapintzakis, John (1998)
      We present recent differential optical reflectivity (DOR) measurements obtained at 633 nm (2.OeV), 780 nm (1.6eV), 1064 nm (1.16eV), and 1310nm (0.95 eV). We discuss calibration techniques which can correct for variations ...