Browsing by Subject "Process Variability"
Now showing items 1-2 of 2
(2012)The widespread proliferation of the Chip Multi-Processor (CMP) paradigm has cemented the criticality of the on-chip interconnection fabric. The Network-on-Chip (NoC) is becoming increasingly susceptible to emerging reliability ...
(2010)Continuous circuit miniaturization and increased process variability point to a future with diminishing returns from dynamic voltage scaling. Operation below Vcc-min has been proposed recently as a mean to reverse this ...