Browsing by Subject "Silicon wafers"
Now showing items 1-6 of 6
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Article
Ellipsometry on optically thin palladium films on silicon-based substrate: Effects of low concentration of hydrogen
(2005)Optically thin palladium films evaporated on silicon substrates are investigated following exposure to low concentrations of hydrogen gas in nitrogen using spectroscopic ellipsometry. Changes in the parameters tan Ψ and Δ ...
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Article
High-resolution quadrature photopyroelectric spectroscopy of a-Si:H thin films deposited on silicon wafers
(1995)The recently developed photothermal technique of quadrature photopyroelectric spectroscopy (Q-PPES) has been applied to measurements of amorphous Si thin films deposited on crystalline Si substrates. Direct, meaningful ...
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Article
Spark ignitable Ni-Al ball-milled powders for bonding applications
(2014)Ball milling of aluminum (Al) and nickel (Ni) particles at the NiAl composition can produce reactive powders with low spark ignition thresholds similar to magnetron sputtered multilayer foils (MFs). Such powders can replace ...
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Article
Spatial dependence of ultrafast carrier recombination centers of phosphorus-implanted and annealed silicon wafers
(2002)In this letter, the spatial dependence of the carrier recombination centers induced in phosphorus-implanted and annealed silicon wafers have been examined. Ultrafast time-resolved reflectivity measurements of a set of ...
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Article
Structure, morphology, and photoluminescence of porous Si nanowires: Effect of different chemical treatments
(2013)The structure and light-emitting properties of Si nanowires (SiNWs) fabricated by a single-step metal-assisted chemical etching (MACE) process on highly boron-doped Si were investigated after different chemical treatments. ...
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Article
Study of the annealing kinetic effect and implantation energy on phosphorus-implanted silicon wafers using spectroscopic ellipsometry
(2006)In this work, we have studied the changes in the optical properties on crystalline silicon implanted wafers (1 × 1013-1 × 1016 P+/cm2) using an extensive ellipsometric analysis. The effects of implantation energy (20-180 ...