Browsing by Subject "Vulnerability factors"
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(Institute of Electrical and Electronics Engineers Inc., 2015)Transistor miniaturization, combined with the dawn of novel switching semiconductor structures, calls for careful examination of the variability and aging of the computer fabric. Time-zero and time-dependent phenomena need ...
(2012)This paper presents a first-order analytical model for determining the performance degradation caused by permanently faulty cells in architectural and non-architectural arrays. We refer to this degradation as the performance ...