Browsing by Subject "X rays"

Now showing items 1-4 of 4

    • Conference Object  

      Direct observation of microscopic inhomogeneities in high-Tc superconductors using energy-dispersive diffraction of synchrotron-produced xrays 

      Skelton, Earl F.; Qadri, Syen B.; Osofsky, Michael S.; Drews, A. R.; Broussard, P. R.; Hu, J. Z.; Finger, L. W.; Vanderah, Terrell A.; Kaiser, D.; Peng, J. L.; Anlage, Steven M.; Greene, Richard L.; Giapintzakis, John (Affiliation: Naval Research Lab., Washington, DC,, USA, United StatesCorrespondence Address: Skelton, Earl F.Naval Research Lab., Washington, DC,, USAUnited States, 1995)
      Evidence of micron-sized structural inhomogeneities in several high transition temperature (T c) superconductors is presented. By illuminating samples with high energy, highly collimated x rays produced on a synchrotron ...
    • Conference Object  

      New image processing models for opacity image analysis in chest radiographs 

      Pattichis, Marios S.; Muralldharan, H.; Pattichis, Constantinos S.; Soliz, P. (Institute of Electrical and Electronics Engineers Inc., 2002)
      The aim of this research is to develop new image processing models that can be used to characterize single opacities and opacity density within pre-selected regions of interest (ROI). We derive our new image processing ...
    • Article  

      Unexpected reduction of vanadium(IV) to vanadium(III) in the presence of the chelate ligands 2,2′-bipyridine (bpy) and 1,8-hydroxyquinoline (Hquin) 

      Manos, Manolis J.; Tasiopoulos, Anastasios J.; Raptopoulou, Catherine P.; Terzis, Aris; Derek Woollins, J.; Slawin, A. M. Z.; Keramidas, Anastasios D.; Kabanos, Themistoklis A. (2001)
      The structures, NMR spectra and electrochemical properties of the vanadium(III) compounds, cis-[VIIICl2-(acac)(bpy)] and [VIII(quin)3]·2CH3OH, formed from [VIVCl2(acac)2]·0.25CH2Cl 2 (Hacac = pentane-2,4-dione) and ...
    • Article  

      X-Ray diffraction investigations of magnetron sputtered TiCN coatings 

      Schneider, J. M.; Voevodin, A.; Rebholz, Claus; Matthews, A.; Hogg, J. H. C.; Lewis, D. B.; Ives, M. (1995)
      X-ray diffraction measurements were performed on titanium carbonitride coatings produced in an electron enhanced, unbalanced magnetron system. The films were deposited onto AISI 316 stainless steel substrates with an argon ...