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Cache reliability for large numbers of permanent faults
(Πανεπιστήμιο Κύπρου, Σχολή Θετικών και Εφαρμοσμένων Επιστημών / University of Cyprus, Faculty of Pure and Applied Sciences, 2010-12)
Process variability in future technology nodes is expected to severely limit the benefits from dynamic voltage scaling. To keep power at bay, low voltage operation has been proposed. Because of the cubic relation between ...