Browsing Τμήμα Φυσικής / Department of Physics by Subject "Critical points"
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Article
Determination of critical points on silicon nanofilms: Surface and quantum confinement effects
(2008)In this work, we present a comprehensive study of the optical properties of nanocrystalline silicon films with thickness varied from 5 to 30 nm. Spectroscopic ellipsometry is employed to determine the dielectric functions ...