Browsing Τμήμα Φυσικής / Department of Physics by Subject "PARAMETERS"
Now showing items 1-1 of 1
-
Article
Optical characterization of varnish films by spectroscopic ellipsometry for application in artwork conservation
(2005)The specific aim of this paper is to measure the optical constants of fresh varnish layers up to a thickness of 10 mum by spectroscopic ellipsometry. It is the first time that this technique has been used in artwork ...