dc.contributor.author | Adapa, R. | en |
dc.contributor.author | Tragoudas, S. | en |
dc.contributor.author | Michael, Maria K. | en |
dc.creator | Adapa, R. | en |
dc.creator | Tragoudas, S. | en |
dc.creator | Michael, Maria K. | en |
dc.date.accessioned | 2019-04-08T07:44:33Z | |
dc.date.available | 2019-04-08T07:44:33Z | |
dc.date.issued | 2011 | |
dc.identifier.uri | http://gnosis.library.ucy.ac.cy/handle/7/42705 | |
dc.source | Integration, the VLSI Journal | en |
dc.source.uri | https://www.scopus.com/inward/record.uri?eid=2-s2.0-79955569842&doi=10.1016%2fj.vlsi.2011.01.002&partnerID=40&md5=feaf9a5403299f03f2daa654f2ce3b24 | |
dc.title | Improved diagnosis using enhanced fault dominance | en |
dc.type | info:eu-repo/semantics/article | |
dc.identifier.doi | 10.1016/j.vlsi.2011.01.002 | |
dc.description.volume | 44 | |
dc.description.issue | 3 | |
dc.description.startingpage | 217 | |
dc.description.endingpage | 228 | |
dc.author.faculty | Πολυτεχνική Σχολή / Faculty of Engineering | |
dc.author.department | Τμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering | |
dc.type.uhtype | Article | en |
dc.source.abbreviation | Integr VLSI J | en |
dc.contributor.orcid | Michael, Maria K. [0000-0002-1943-6547] | |
dc.gnosis.orcid | 0000-0002-1943-6547 | |