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Improved diagnosis using enhanced fault dominance

dc.contributor.authorAdapa, R.en
dc.contributor.authorTragoudas, S.en
dc.contributor.authorMichael, Maria K.en
dc.creatorAdapa, R.en
dc.creatorTragoudas, S.en
dc.creatorMichael, Maria K.en
dc.date.accessioned2019-04-08T07:44:33Z
dc.date.available2019-04-08T07:44:33Z
dc.date.issued2011
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/42705
dc.sourceIntegration, the VLSI Journalen
dc.source.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-79955569842&doi=10.1016%2fj.vlsi.2011.01.002&partnerID=40&md5=feaf9a5403299f03f2daa654f2ce3b24
dc.titleImproved diagnosis using enhanced fault dominanceen
dc.typeinfo:eu-repo/semantics/article
dc.identifier.doi10.1016/j.vlsi.2011.01.002
dc.description.volume44
dc.description.issue3
dc.description.startingpage217
dc.description.endingpage228
dc.author.facultyΠολυτεχνική Σχολή / Faculty of Engineering
dc.author.departmentΤμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering
dc.type.uhtypeArticleen
dc.source.abbreviationIntegr VLSI Jen
dc.contributor.orcidMichael, Maria K. [0000-0002-1943-6547]
dc.gnosis.orcid0000-0002-1943-6547


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