dc.contributor.author | Adapa, R. | en |
dc.contributor.author | Tragoudas, S. | en |
dc.contributor.author | Michael, Maria K. | en |
dc.creator | Adapa, R. | en |
dc.creator | Tragoudas, S. | en |
dc.creator | Michael, Maria K. | en |
dc.date.accessioned | 2019-04-08T07:44:33Z | |
dc.date.available | 2019-04-08T07:44:33Z | |
dc.date.issued | 2007 | |
dc.identifier.uri | http://gnosis.library.ucy.ac.cy/handle/7/42706 | |
dc.source | Proceedings of the IEEE VLSI Test Symposium | en |
dc.source | Proceedings of the IEEE VLSI Test Symposium | en |
dc.source.uri | https://www.scopus.com/inward/record.uri?eid=2-s2.0-37549032529&doi=10.1109%2fVTS.2007.10&partnerID=40&md5=f6060eb2b8038e7d317fa13fc54fad8f | |
dc.title | Accelerating diagnosis via dominance relations between sets of faults | en |
dc.type | info:eu-repo/semantics/conferenceObject | |
dc.identifier.doi | 10.1109/VTS.2007.10 | |
dc.description.startingpage | 219 | |
dc.description.endingpage | 224 | |
dc.author.faculty | Πολυτεχνική Σχολή / Faculty of Engineering | |
dc.author.department | Τμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering | |
dc.type.uhtype | Conference Object | en |
dc.contributor.orcid | Michael, Maria K. [0000-0002-1943-6547] | |
dc.gnosis.orcid | 0000-0002-1943-6547 | |