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Sub-faults identification for collapsing in diagnosis

dc.contributor.authorAdapa, R.en
dc.contributor.authorTragoudas, S.en
dc.contributor.authorMichael, Maria K.en
dc.creatorAdapa, R.en
dc.creatorTragoudas, S.en
dc.creatorMichael, Maria K.en
dc.date.accessioned2019-04-08T07:44:33Z
dc.date.available2019-04-08T07:44:33Z
dc.date.issued2006
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/42707
dc.sourceProceedings - IEEE International Symposium on Circuits and Systemsen
dc.sourceProceedings - IEEE International Symposium on Circuits and Systemsen
dc.source.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-34547337723&partnerID=40&md5=0ac6603b1f90cef822a58456408e7339
dc.titleSub-faults identification for collapsing in diagnosisen
dc.typeinfo:eu-repo/semantics/conferenceObject
dc.description.startingpage815
dc.description.endingpage818
dc.author.facultyΠολυτεχνική Σχολή / Faculty of Engineering
dc.author.departmentΤμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering
dc.type.uhtypeConference Objecten
dc.contributor.orcidMichael, Maria K. [0000-0002-1943-6547]
dc.gnosis.orcid0000-0002-1943-6547


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