dc.contributor.author | Chen, J. | en |
dc.contributor.author | Keroglou, C. | en |
dc.contributor.author | Hadjicostis, Christoforos N. | en |
dc.contributor.author | Kumar, R. | en |
dc.creator | Chen, J. | en |
dc.creator | Keroglou, C. | en |
dc.creator | Hadjicostis, Christoforos N. | en |
dc.creator | Kumar, R. | en |
dc.date.accessioned | 2019-04-08T07:45:23Z | |
dc.date.available | 2019-04-08T07:45:23Z | |
dc.date.issued | 2018 | |
dc.identifier.uri | http://gnosis.library.ucy.ac.cy/handle/7/43155 | |
dc.description.abstract | This paper provides revisions to the algorithms presented by Chen et al., 2013 for testing diagnosability of stochastic discrete-event systems. Additional new contributions include PSPACE-hardness of verifying strong stochastic diagnosability (referred as A-Diagnosability in Thorsley et al., 2005) and a necessary and sufficient condition for testing stochastic diagnosability (referred as AA-Diagnosability in Thorsley et al., 2005) that involves a new notion of probabilistic equivalence.Note to Practitioners - Detecting system failures is essential prior to fault mitigation. For stochastic discrete-event systems, the property of stochastic diagnosability (S-Diagnosability) allows one to detect any system failure with arbitrarily small error bound and within bounded delay. This paper contributes by revising and extending the results in the previous work by Chen et al., 2013, regarding the verification of S-Diagnosability. © 2004-2012 IEEE. | en |
dc.source | IEEE Transactions on Automation Science and Engineering | en |
dc.source.uri | https://www.scopus.com/inward/record.uri?eid=2-s2.0-84966309073&doi=10.1109%2fTASE.2016.2551746&partnerID=40&md5=058f3f6c194a5c551bd11c989a6d2cf9 | |
dc.subject | Algorithms | en |
dc.subject | Stochastic systems | en |
dc.subject | Diagnosability | en |
dc.subject | Discrete event simulation | en |
dc.subject | Aluminum | en |
dc.subject | Complexity | en |
dc.subject | Diagnosability of discrete event systems | en |
dc.subject | Discrete-event systems (dess) | en |
dc.subject | Failure diagnosis | en |
dc.subject | Probabilistic equivalences | en |
dc.subject | Pspace-hardness | en |
dc.subject | Stochastic discrete event systems | en |
dc.title | Revised Test for Stochastic Diagnosability of Discrete-Event Systems | en |
dc.type | info:eu-repo/semantics/article | |
dc.identifier.doi | 10.1109/TASE.2016.2551746 | |
dc.description.volume | 15 | |
dc.description.issue | 1 | |
dc.description.startingpage | 404 | |
dc.description.endingpage | 408 | |
dc.author.faculty | Πολυτεχνική Σχολή / Faculty of Engineering | |
dc.author.department | Τμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering | |
dc.type.uhtype | Article | en |
dc.source.abbreviation | IEEE Trans.Autom.Sci.Eng. | en |
dc.contributor.orcid | Hadjicostis, Christoforos N. [0000-0002-1706-708X] | |
dc.gnosis.orcid | 0000-0002-1706-708X | |