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dc.contributor.authorChen, J.en
dc.contributor.authorKeroglou, C.en
dc.contributor.authorHadjicostis, Christoforos N.en
dc.contributor.authorKumar, R.en
dc.creatorChen, J.en
dc.creatorKeroglou, C.en
dc.creatorHadjicostis, Christoforos N.en
dc.creatorKumar, R.en
dc.date.accessioned2019-04-08T07:45:23Z
dc.date.available2019-04-08T07:45:23Z
dc.date.issued2018
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/43155
dc.description.abstractThis paper provides revisions to the algorithms presented by Chen et al., 2013 for testing diagnosability of stochastic discrete-event systems. Additional new contributions include PSPACE-hardness of verifying strong stochastic diagnosability (referred as A-Diagnosability in Thorsley et al., 2005) and a necessary and sufficient condition for testing stochastic diagnosability (referred as AA-Diagnosability in Thorsley et al., 2005) that involves a new notion of probabilistic equivalence.Note to Practitioners - Detecting system failures is essential prior to fault mitigation. For stochastic discrete-event systems, the property of stochastic diagnosability (S-Diagnosability) allows one to detect any system failure with arbitrarily small error bound and within bounded delay. This paper contributes by revising and extending the results in the previous work by Chen et al., 2013, regarding the verification of S-Diagnosability. © 2004-2012 IEEE.en
dc.sourceIEEE Transactions on Automation Science and Engineeringen
dc.source.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-84966309073&doi=10.1109%2fTASE.2016.2551746&partnerID=40&md5=058f3f6c194a5c551bd11c989a6d2cf9
dc.subjectAlgorithmsen
dc.subjectStochastic systemsen
dc.subjectDiagnosabilityen
dc.subjectDiscrete event simulationen
dc.subjectAluminumen
dc.subjectComplexityen
dc.subjectDiagnosability of discrete event systemsen
dc.subjectDiscrete-event systems (dess)en
dc.subjectFailure diagnosisen
dc.subjectProbabilistic equivalencesen
dc.subjectPspace-hardnessen
dc.subjectStochastic discrete event systemsen
dc.titleRevised Test for Stochastic Diagnosability of Discrete-Event Systemsen
dc.typeinfo:eu-repo/semantics/article
dc.identifier.doi10.1109/TASE.2016.2551746
dc.description.volume15
dc.description.issue1
dc.description.startingpage404
dc.description.endingpage408
dc.author.facultyΠολυτεχνική Σχολή / Faculty of Engineering
dc.author.departmentΤμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering
dc.type.uhtypeArticleen
dc.source.abbreviationIEEE Trans.Autom.Sci.Eng.en
dc.contributor.orcidHadjicostis, Christoforos N. [0000-0002-1706-708X]
dc.gnosis.orcid0000-0002-1706-708X


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