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dc.contributor.authorFarrington, N. E. S.en
dc.contributor.authorIezekiel, Stavrosen
dc.creatorFarrington, N. E. S.en
dc.creatorIezekiel, Stavrosen
dc.date.accessioned2019-04-08T07:45:51Z
dc.date.available2019-04-08T07:45:51Z
dc.date.issued2011
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/43425
dc.sourceJournal of Micro/Nanolithography, MEMS, and MOEMSen
dc.source.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-79955968641&doi=10.1117%2f1.3563599&partnerID=40&md5=323a216add5005eee5510cf454582949
dc.titleAccurate layer thickness control and planarization for multilayer SU-8 structuresen
dc.typeinfo:eu-repo/semantics/article
dc.identifier.doi10.1117/1.3563599
dc.description.volume10
dc.description.issue1
dc.author.facultyΠολυτεχνική Σχολή / Faculty of Engineering
dc.author.departmentΤμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering
dc.type.uhtypeArticleen
dc.source.abbreviationJ.Micro/ Nanolithogr.MEMS MOEMSen
dc.contributor.orcidIezekiel, Stavros [0000-0002-5933-3489]
dc.gnosis.orcid0000-0002-5933-3489


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