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Investigating the limits of AVF analysis in the presence of multiple bit errors

dc.contributor.authorManiatakos, M.en
dc.contributor.authorMichael, Maria K.en
dc.contributor.authorMakris, Y.en
dc.creatorManiatakos, M.en
dc.creatorMichael, Maria K.en
dc.creatorMakris, Y.en
dc.date.accessioned2019-04-08T07:47:06Z
dc.date.available2019-04-08T07:47:06Z
dc.date.issued2013
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/44162
dc.sourceProceedings of the 2013 IEEE 19th International On-Line Testing Symposium, IOLTS 2013en
dc.sourceProceedings of the 2013 IEEE 19th International On-Line Testing Symposium, IOLTS 2013en
dc.source.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-84885207616&doi=10.1109%2fIOLTS.2013.6604050&partnerID=40&md5=e2c56a62ad3b9ebcb26dfa6f942a8e0a
dc.titleInvestigating the limits of AVF analysis in the presence of multiple bit errorsen
dc.typeinfo:eu-repo/semantics/conferenceObject
dc.identifier.doi10.1109/IOLTS.2013.6604050
dc.description.startingpage49
dc.description.endingpage54
dc.author.facultyΠολυτεχνική Σχολή / Faculty of Engineering
dc.author.departmentΤμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering
dc.type.uhtypeConference Objecten
dc.contributor.orcidMichael, Maria K. [0000-0002-1943-6547]
dc.gnosis.orcid0000-0002-1943-6547


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