| dc.contributor.author | Michael, Maria K. | en |
| dc.creator | Michael, Maria K. | en |
| dc.date.accessioned | 2019-04-08T07:47:11Z | |
| dc.date.available | 2019-04-08T07:47:11Z | |
| dc.date.issued | 1998 | |
| dc.identifier.uri | http://gnosis.library.ucy.ac.cy/handle/7/44214 | |
| dc.publisher | Southern Illinois University at Carbondale | en |
| dc.subject | Computer science department | en |
| dc.title | Test Pattern Generation for Delay Faults at the Functional Level | en |
| dc.type | info:eu-repo/semantics/doctoralThesis | |
| dc.author.faculty | Πολυτεχνική Σχολή / Faculty of Engineering | |
| dc.author.department | Τμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering | |
| dc.type.uhtype | Doctoral Thesis | en |
| dc.contributor.orcid | Michael, Maria K. [0000-0002-1943-6547] | |
| dc.gnosis.orcid | 0000-0002-1943-6547 | |
