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Towards finding path delay fault tests with high test efficiency using ZBDDs

dc.contributor.authorMichael, Maria K.en
dc.contributor.authorChristou, K.en
dc.contributor.authorTragoudas, S.en
dc.creatorMichael, Maria K.en
dc.creatorChristou, K.en
dc.creatorTragoudas, S.en
dc.date.accessioned2019-04-08T07:47:11Z
dc.date.available2019-04-08T07:47:11Z
dc.date.issued2005
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/44215
dc.sourceProceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processorsen
dc.sourceProceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processorsen
dc.source.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-33748548373&doi=10.1109%2fICCD.2005.109&partnerID=40&md5=80da37346911242f162ae8042b2ea12b
dc.titleTowards finding path delay fault tests with high test efficiency using ZBDDsen
dc.typeinfo:eu-repo/semantics/conferenceObject
dc.identifier.doi10.1109/ICCD.2005.109
dc.description.volume2005
dc.description.startingpage464
dc.description.endingpage467
dc.author.facultyΠολυτεχνική Σχολή / Faculty of Engineering
dc.author.departmentΤμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering
dc.type.uhtypeConference Objecten
dc.contributor.orcidMichael, Maria K. [0000-0002-1943-6547]
dc.gnosis.orcid0000-0002-1943-6547


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