dc.contributor.author | Michael, Maria K. | en |
dc.contributor.author | Christou, K. | en |
dc.contributor.author | Tragoudas, S. | en |
dc.creator | Michael, Maria K. | en |
dc.creator | Christou, K. | en |
dc.creator | Tragoudas, S. | en |
dc.date.accessioned | 2019-04-08T07:47:11Z | |
dc.date.available | 2019-04-08T07:47:11Z | |
dc.date.issued | 2005 | |
dc.identifier.uri | http://gnosis.library.ucy.ac.cy/handle/7/44215 | |
dc.source | Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors | en |
dc.source | Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors | en |
dc.source.uri | https://www.scopus.com/inward/record.uri?eid=2-s2.0-33748548373&doi=10.1109%2fICCD.2005.109&partnerID=40&md5=80da37346911242f162ae8042b2ea12b | |
dc.title | Towards finding path delay fault tests with high test efficiency using ZBDDs | en |
dc.type | info:eu-repo/semantics/conferenceObject | |
dc.identifier.doi | 10.1109/ICCD.2005.109 | |
dc.description.volume | 2005 | |
dc.description.startingpage | 464 | |
dc.description.endingpage | 467 | |
dc.author.faculty | Πολυτεχνική Σχολή / Faculty of Engineering | |
dc.author.department | Τμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering | |
dc.type.uhtype | Conference Object | en |
dc.contributor.orcid | Michael, Maria K. [0000-0002-1943-6547] | |
dc.gnosis.orcid | 0000-0002-1943-6547 | |