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Functions for quality transition fault tests

dc.contributor.authorMichael, Maria K.en
dc.contributor.authorNeophytou, S.en
dc.contributor.authorTragoudas, S.en
dc.creatorMichael, Maria K.en
dc.creatorNeophytou, S.en
dc.creatorTragoudas, S.en
dc.date.accessioned2019-04-08T07:47:11Z
dc.date.available2019-04-08T07:47:11Z
dc.date.issued2005
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/44218
dc.sourceProceedings - International Symposium on Quality Electronic Design, ISQEDen
dc.sourceProceedings - International Symposium on Quality Electronic Design, ISQEDen
dc.source.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-84886679995&doi=10.1109%2fISQED.2005.60&partnerID=40&md5=32b1f1eb5071a1cca040965bb96e1132
dc.titleFunctions for quality transition fault testsen
dc.typeinfo:eu-repo/semantics/conferenceObject
dc.identifier.doi10.1109/ISQED.2005.60
dc.description.startingpage327
dc.description.endingpage332
dc.author.facultyΠολυτεχνική Σχολή / Faculty of Engineering
dc.author.departmentΤμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering
dc.type.uhtypeConference Objecten
dc.contributor.orcidMichael, Maria K. [0000-0002-1943-6547]
dc.gnosis.orcid0000-0002-1943-6547


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