dc.contributor.author | Michael, Maria K. | en |
dc.contributor.author | Stratigopoulos, H. G. | en |
dc.creator | Michael, Maria K. | en |
dc.creator | Stratigopoulos, H. G. | en |
dc.date.accessioned | 2019-04-08T07:47:11Z | |
dc.date.available | 2019-04-08T07:47:11Z | |
dc.date.issued | 2017 | |
dc.identifier.uri | http://gnosis.library.ucy.ac.cy/handle/7/44219 | |
dc.source | IEEE Design and Test | en |
dc.source.uri | https://www.scopus.com/inward/record.uri?eid=2-s2.0-85028513744&doi=10.1109%2fMDAT.2017.2741460&partnerID=40&md5=d637702f21f5fb7f20ec429fc35b1354 | |
dc.title | Recap of the European Test Symposium 2017 (ETS'17) | en |
dc.type | info:eu-repo/semantics/article | |
dc.identifier.doi | 10.1109/MDAT.2017.2741460 | |
dc.description.volume | 34 | |
dc.description.issue | 6 | |
dc.description.startingpage | 119 | |
dc.description.endingpage | 120 | |
dc.author.faculty | Πολυτεχνική Σχολή / Faculty of Engineering | |
dc.author.department | Τμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering | |
dc.type.uhtype | Article | en |
dc.source.abbreviation | IEEE Des.Test | en |
dc.contributor.orcid | Michael, Maria K. [0000-0002-1943-6547] | |
dc.gnosis.orcid | 0000-0002-1943-6547 | |