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Fault tolerant maximum likelihood event localization in sensor networks using binary data

dc.contributor.authorMichaelides, M. P.en
dc.contributor.authorPanayiotou, Christos G.en
dc.creatorMichaelides, M. P.en
dc.creatorPanayiotou, Christos G.en
dc.date.accessioned2019-04-08T07:47:13Z
dc.date.available2019-04-08T07:47:13Z
dc.date.issued2009
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/44235
dc.sourceIEEE Signal Processing Lettersen
dc.source.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-64249153565&doi=10.1109%2fLSP.2009.2016481&partnerID=40&md5=bc080a772083986c7e4e7bc83e034d7b
dc.titleFault tolerant maximum likelihood event localization in sensor networks using binary dataen
dc.typeinfo:eu-repo/semantics/article
dc.identifier.doi10.1109/LSP.2009.2016481
dc.description.volume16
dc.description.issue5
dc.description.startingpage406
dc.description.endingpage409
dc.author.facultyΠολυτεχνική Σχολή / Faculty of Engineering
dc.author.departmentΤμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering
dc.type.uhtypeArticleen
dc.source.abbreviationIEEE Signal Process.Lett.en
dc.contributor.orcidPanayiotou, Christos G. [0000-0002-6476-9025]
dc.gnosis.orcid0000-0002-6476-9025


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