Show simple item record

On the relaxation of n-detect test sets

dc.contributor.authorNeophytou, S.en
dc.contributor.authorMichael, Maria K.en
dc.creatorNeophytou, S.en
dc.creatorMichael, Maria K.en
dc.date.accessioned2019-04-08T07:47:22Z
dc.date.available2019-04-08T07:47:22Z
dc.date.issued2008
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/44327
dc.sourceProceedings of the IEEE VLSI Test Symposiumen
dc.sourceProceedings of the IEEE VLSI Test Symposiumen
dc.source.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-51449110166&doi=10.1109%2fVTS.2008.14&partnerID=40&md5=6ae522d90bc29581e3eed2871be83784
dc.titleOn the relaxation of n-detect test setsen
dc.typeinfo:eu-repo/semantics/conferenceObject
dc.identifier.doi10.1109/VTS.2008.14
dc.description.startingpage187
dc.description.endingpage192
dc.author.facultyΠολυτεχνική Σχολή / Faculty of Engineering
dc.author.departmentΤμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering
dc.type.uhtypeConference Objecten
dc.contributor.orcidMichael, Maria K. [0000-0002-1943-6547]
dc.gnosis.orcid0000-0002-1943-6547


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following Collection(s)

Show simple item record