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Two new methods for accurate test set relaxation via test set replacement

dc.contributor.authorNeophytou, S.en
dc.contributor.authorMichael, Maria K.en
dc.creatorNeophytou, S.en
dc.creatorMichael, Maria K.en
dc.date.accessioned2019-04-08T07:47:22Z
dc.date.available2019-04-08T07:47:22Z
dc.date.issued2008
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/44328
dc.sourceProceedings of the 9th International Symposium on Quality Electronic Design, ISQED 2008en
dc.sourceProceedings of the 9th International Symposium on Quality Electronic Design, ISQED 2008en
dc.source.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-49749152481&doi=10.1109%2fISQED.2008.4479845&partnerID=40&md5=ca11fdc15e7ba1455baa0d2a74d281f8
dc.titleTwo new methods for accurate test set relaxation via test set replacementen
dc.typeinfo:eu-repo/semantics/conferenceObject
dc.identifier.doi10.1109/ISQED.2008.4479845
dc.description.startingpage827
dc.description.endingpage831
dc.author.facultyΠολυτεχνική Σχολή / Faculty of Engineering
dc.author.departmentΤμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering
dc.type.uhtypeConference Objecten
dc.contributor.orcidMichael, Maria K. [0000-0002-1943-6547]
dc.gnosis.orcid0000-0002-1943-6547


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