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dc.contributor.authorNeophytou, S.en
dc.contributor.authorMichael, Maria K.en
dc.creatorNeophytou, S.en
dc.creatorMichael, Maria K.en
dc.date.accessioned2019-04-08T07:47:22Z
dc.date.available2019-04-08T07:47:22Z
dc.date.issued2007
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/44329
dc.sourceProceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systemsen
dc.sourceProceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systemsen
dc.source.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-84887451076&doi=10.1109%2fDFT.2007.46&partnerID=40&md5=fae0e8c83cb0f636a27e784b3fb2c19a
dc.titleHierarchical fault compatibility identification for test generation with a small number of specified bitsen
dc.typeinfo:eu-repo/semantics/conferenceObject
dc.identifier.doi10.1109/DFT.2007.46
dc.description.startingpage439
dc.description.endingpage447
dc.author.facultyΠολυτεχνική Σχολή / Faculty of Engineering
dc.author.departmentΤμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering
dc.type.uhtypeConference Objecten
dc.contributor.orcidMichael, Maria K. [0000-0002-1943-6547]


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