dc.contributor.author | Neophytou, S. | en |
dc.contributor.author | Michael, Maria K. | en |
dc.creator | Neophytou, S. | en |
dc.creator | Michael, Maria K. | en |
dc.date.accessioned | 2019-04-08T07:47:22Z | |
dc.date.available | 2019-04-08T07:47:22Z | |
dc.date.issued | 2007 | |
dc.identifier.uri | http://gnosis.library.ucy.ac.cy/handle/7/44329 | |
dc.source | Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems | en |
dc.source | Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems | en |
dc.source.uri | https://www.scopus.com/inward/record.uri?eid=2-s2.0-84887451076&doi=10.1109%2fDFT.2007.46&partnerID=40&md5=fae0e8c83cb0f636a27e784b3fb2c19a | |
dc.title | Hierarchical fault compatibility identification for test generation with a small number of specified bits | en |
dc.type | info:eu-repo/semantics/conferenceObject | |
dc.identifier.doi | 10.1109/DFT.2007.46 | |
dc.description.startingpage | 439 | |
dc.description.endingpage | 447 | |
dc.author.faculty | Πολυτεχνική Σχολή / Faculty of Engineering | |
dc.author.department | Τμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering | |
dc.type.uhtype | Conference Object | en |
dc.contributor.orcid | Michael, Maria K. [0000-0002-1943-6547] | |
dc.gnosis.orcid | 0000-0002-1943-6547 | |