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Generating diverse test sets for multiple fault detections based on fault cone partitioning

dc.contributor.authorNeophytou, S.en
dc.contributor.authorMichael, Maria K.en
dc.contributor.authorChristou, K.en
dc.creatorNeophytou, S.en
dc.creatorMichael, Maria K.en
dc.creatorChristou, K.en
dc.date.accessioned2019-04-08T07:47:22Z
dc.date.available2019-04-08T07:47:22Z
dc.date.issued2009
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/44330
dc.sourceProceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systemsen
dc.sourceProceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systemsen
dc.source.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-77649317611&doi=10.1109%2fDFT.2009.24&partnerID=40&md5=19f76d51bb5cf601daac76f0423d4fc3
dc.titleGenerating diverse test sets for multiple fault detections based on fault cone partitioningen
dc.typeinfo:eu-repo/semantics/conferenceObject
dc.identifier.doi10.1109/DFT.2009.24
dc.description.startingpage401
dc.description.endingpage409
dc.author.facultyΠολυτεχνική Σχολή / Faculty of Engineering
dc.author.departmentΤμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering
dc.type.uhtypeConference Objecten
dc.contributor.orcidMichael, Maria K. [0000-0002-1943-6547]
dc.gnosis.orcid0000-0002-1943-6547


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