dc.contributor.author | Neophytou, S. N. | en |
dc.contributor.author | Christou, K. | en |
dc.contributor.author | Michael, Maria K. | en |
dc.creator | Neophytou, S. N. | en |
dc.creator | Christou, K. | en |
dc.creator | Michael, Maria K. | en |
dc.date.accessioned | 2019-04-08T07:47:23Z | |
dc.date.available | 2019-04-08T07:47:23Z | |
dc.date.issued | 2012 | |
dc.identifier.uri | http://gnosis.library.ucy.ac.cy/handle/7/44333 | |
dc.source | Journal of Electronic Testing: Theory and Applications (JETTA) | en |
dc.source.uri | https://www.scopus.com/inward/record.uri?eid=2-s2.0-84878473108&doi=10.1007%2fs10836-012-5333-0&partnerID=40&md5=19de0100eecaa6074bfa0989b3eb6a8e | |
dc.title | A non-enumerative technique for measuring path correlation in digital circuits | en |
dc.type | info:eu-repo/semantics/article | |
dc.identifier.doi | 10.1007/s10836-012-5333-0 | |
dc.description.volume | 28 | |
dc.description.issue | 6 | |
dc.description.startingpage | 843 | |
dc.description.endingpage | 856 | |
dc.author.faculty | Πολυτεχνική Σχολή / Faculty of Engineering | |
dc.author.department | Τμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering | |
dc.type.uhtype | Article | en |
dc.source.abbreviation | J Electron Test Theory Appl JETTA | en |
dc.contributor.orcid | Michael, Maria K. [0000-0002-1943-6547] | |
dc.gnosis.orcid | 0000-0002-1943-6547 | |