Tackling the complexity of exact path delay fault grading for path intensive circuits

dc.contributor.author	Neophytou, S. N.	en
dc.contributor.author	Michael, Maria K.	en
dc.creator	Neophytou, S. N.	en
dc.creator	Michael, Maria K.	en
dc.date.accessioned	2019-04-08T07:47:23Z
dc.date.available	2019-04-08T07:47:23Z
dc.date.issued	2015
dc.identifier.uri	http://gnosis.library.ucy.ac.cy/handle/7/44334
dc.source	Proceedings - 2015 20th IEEE European Test Symposium, ETS 2014	en
dc.source	Proceedings - 2015 20th IEEE European Test Symposium, ETS 2014	en
dc.source.uri	https://www.scopus.com/inward/record.uri?eid=2-s2.0-84942543455&doi=10.1109%2fETS.2015.7138741&partnerID=40&md5=3b3ed097093aa402c7c573e8ae6b5355
dc.title	Tackling the complexity of exact path delay fault grading for path intensive circuits	en
dc.type	info:eu-repo/semantics/conferenceObject
dc.identifier.doi	10.1109/ETS.2015.7138741
dc.author.faculty	Πολυτεχνική Σχολή / Faculty of Engineering
dc.author.department	Τμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering
dc.type.uhtype	Conference Object	en
dc.contributor.orcid	Michael, Maria K. [0000-0002-1943-6547]
dc.gnosis.orcid	0000-0002-1943-6547

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