Test set generation with a large number of unspecified bits using static and dynamic techniques

dc.contributor.author	Neophytou, S. N.	en
dc.contributor.author	Michael, Maria K.	en
dc.creator	Neophytou, S. N.	en
dc.creator	Michael, Maria K.	en
dc.date.accessioned	2019-04-08T07:47:23Z
dc.date.available	2019-04-08T07:47:23Z
dc.date.issued	2010
dc.identifier.uri	http://gnosis.library.ucy.ac.cy/handle/7/44337
dc.source	IEEE Transactions on Computers	en
dc.source.uri	https://www.scopus.com/inward/record.uri?eid=2-s2.0-76549120488&doi=10.1109%2fTC.2009.178&partnerID=40&md5=75a09f4632eaa83c055b592fbb698dca
dc.title	Test set generation with a large number of unspecified bits using static and dynamic techniques	en
dc.type	info:eu-repo/semantics/article
dc.identifier.doi	10.1109/TC.2009.178
dc.description.volume	59
dc.description.issue	3
dc.description.startingpage	301
dc.description.endingpage	316
dc.author.faculty	Πολυτεχνική Σχολή / Faculty of Engineering
dc.author.department	Τμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering
dc.type.uhtype	Article	en
dc.source.abbreviation	IEEE Trans.Comput.	en
dc.contributor.orcid	Michael, Maria K. [0000-0002-1943-6547]
dc.gnosis.orcid	0000-0002-1943-6547

Files in this item

Files	Size	Format	View
There are no files associated with this item.