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dc.contributor.authorNeophytou, S. N.en
dc.contributor.authorMichael, Maria K.en
dc.creatorNeophytou, S. N.en
dc.creatorMichael, Maria K.en
dc.date.accessioned2019-04-08T07:47:23Z
dc.date.available2019-04-08T07:47:23Z
dc.date.issued2010
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/44337
dc.sourceIEEE Transactions on Computersen
dc.source.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-76549120488&doi=10.1109%2fTC.2009.178&partnerID=40&md5=75a09f4632eaa83c055b592fbb698dca
dc.titleTest set generation with a large number of unspecified bits using static and dynamic techniquesen
dc.typeinfo:eu-repo/semantics/article
dc.identifier.doi10.1109/TC.2009.178
dc.description.volume59
dc.description.issue3
dc.description.startingpage301
dc.description.endingpage316
dc.author.facultyΠολυτεχνική Σχολή / Faculty of Engineering
dc.author.departmentΤμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering
dc.type.uhtypeArticleen
dc.source.abbreviationIEEE Trans.Comput.en
dc.contributor.orcidMichael, Maria K. [0000-0002-1943-6547]


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