Exact path delay grading with fundamental BDD operations

dc.contributor.author	Padmanaban, S.	en
dc.contributor.author	Michael, Maria K.	en
dc.contributor.author	Tragoudas, S.	en
dc.creator	Padmanaban, S.	en
dc.creator	Michael, Maria K.	en
dc.creator	Tragoudas, S.	en
dc.date.accessioned	2019-04-08T07:47:34Z
dc.date.available	2019-04-08T07:47:34Z
dc.date.issued	2001
dc.identifier.uri	http://gnosis.library.ucy.ac.cy/handle/7/44447
dc.source	IEEE International Test Conference (TC)	en
dc.source.uri	https://www.scopus.com/inward/record.uri?eid=2-s2.0-0035687354&doi=10.1109%2fTEST.2001.966684&partnerID=40&md5=e5164e92c6fdc6336c848f0a507d2ec2
dc.title	Exact path delay grading with fundamental BDD operations	en
dc.type	info:eu-repo/semantics/article
dc.identifier.doi	10.1109/TEST.2001.966684
dc.description.issue	Journal Article	en
dc.description.startingpage	642
dc.description.endingpage	651
dc.author.faculty	Πολυτεχνική Σχολή / Faculty of Engineering
dc.author.department	Τμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering
dc.type.uhtype	Article	en
dc.source.abbreviation	IEEE Int Test Conf TC	en
dc.contributor.orcid	Michael, Maria K. [0000-0002-1943-6547]
dc.gnosis.orcid	0000-0002-1943-6547

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