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Towards optimal CMOS lifetime via unified reliability modeling and multi-objective optimization

dc.contributor.authorPapadopoulos, A.en
dc.contributor.authorTheocharides, Theocharisen
dc.contributor.authorMichael, Maria K.en
dc.creatorPapadopoulos, A.en
dc.creatorTheocharides, Theocharisen
dc.creatorMichael, Maria K.en
dc.date.accessioned2019-04-08T07:47:41Z
dc.date.available2019-04-08T07:47:41Z
dc.date.issued2011
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/44517
dc.sourceProceedings - IEEE International Symposium on Circuits and Systemsen
dc.sourceProceedings - IEEE International Symposium on Circuits and Systemsen
dc.source.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-79960881410&doi=10.1109%2fISCAS.2011.5937749&partnerID=40&md5=620c4e9ee2653f92745cbce5dcd20d0e
dc.titleTowards optimal CMOS lifetime via unified reliability modeling and multi-objective optimizationen
dc.typeinfo:eu-repo/semantics/conferenceObject
dc.identifier.doi10.1109/ISCAS.2011.5937749
dc.description.startingpage1049
dc.description.endingpage1052
dc.author.facultyΠολυτεχνική Σχολή / Faculty of Engineering
dc.author.departmentΤμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering
dc.type.uhtypeConference Objecten
dc.contributor.orcidTheocharides, Theocharis [0000-0001-7222-9152]
dc.contributor.orcidMichael, Maria K. [0000-0002-1943-6547]
dc.gnosis.orcid0000-0001-7222-9152
dc.gnosis.orcid0000-0002-1943-6547


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