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The effect of shunt resistance on External Quantum Efficiency measurements at high light bias conditions

dc.contributor.authorParaskeva, V.en
dc.contributor.authorHadjipanayi, M.en
dc.contributor.authorNorton, M.en
dc.contributor.authorPravettoni, M.en
dc.contributor.authorGeorghiou, George E.en
dc.creatorParaskeva, V.en
dc.creatorHadjipanayi, M.en
dc.creatorNorton, M.en
dc.creatorPravettoni, M.en
dc.creatorGeorghiou, George E.en
dc.date.accessioned2019-04-08T07:47:42Z
dc.date.available2019-04-08T07:47:42Z
dc.date.issued2014
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/44530
dc.source2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014en
dc.source2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014en
dc.source.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-84912098866&doi=10.1109%2fPVSC.2014.6924902&partnerID=40&md5=8b64731b65b5dcac3f482b10a386e111
dc.titleThe effect of shunt resistance on External Quantum Efficiency measurements at high light bias conditionsen
dc.typeinfo:eu-repo/semantics/conferenceObject
dc.identifier.doi10.1109/PVSC.2014.6924902
dc.description.startingpage3664
dc.description.endingpage3669
dc.author.facultyΠολυτεχνική Σχολή / Faculty of Engineering
dc.author.departmentΤμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering
dc.type.uhtypeConference Objecten
dc.contributor.orcidGeorghiou, George E. [0000-0002-5872-5851]
dc.gnosis.orcid0000-0002-5872-5851


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