dc.contributor.author | Paraskeva, V. | en |
dc.contributor.author | Hadjipanayi, M. | en |
dc.contributor.author | Norton, M. | en |
dc.contributor.author | Pravettoni, M. | en |
dc.contributor.author | Georghiou, George E. | en |
dc.creator | Paraskeva, V. | en |
dc.creator | Hadjipanayi, M. | en |
dc.creator | Norton, M. | en |
dc.creator | Pravettoni, M. | en |
dc.creator | Georghiou, George E. | en |
dc.date.accessioned | 2019-04-08T07:47:42Z | |
dc.date.available | 2019-04-08T07:47:42Z | |
dc.date.issued | 2014 | |
dc.identifier.uri | http://gnosis.library.ucy.ac.cy/handle/7/44530 | |
dc.source | 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014 | en |
dc.source | 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014 | en |
dc.source.uri | https://www.scopus.com/inward/record.uri?eid=2-s2.0-84912098866&doi=10.1109%2fPVSC.2014.6924902&partnerID=40&md5=8b64731b65b5dcac3f482b10a386e111 | |
dc.title | The effect of shunt resistance on External Quantum Efficiency measurements at high light bias conditions | en |
dc.type | info:eu-repo/semantics/conferenceObject | |
dc.identifier.doi | 10.1109/PVSC.2014.6924902 | |
dc.description.startingpage | 3664 | |
dc.description.endingpage | 3669 | |
dc.author.faculty | Πολυτεχνική Σχολή / Faculty of Engineering | |
dc.author.department | Τμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering | |
dc.type.uhtype | Conference Object | en |
dc.contributor.orcid | Georghiou, George E. [0000-0002-5872-5851] | |
dc.gnosis.orcid | 0000-0002-5872-5851 | |