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Sensitivity of SRAM Cell Most Probable SNM Failure Point to Time-Dependent Variability

dc.contributor.authorRodopoulos, D.en
dc.contributor.authorSazeides, Y.en
dc.contributor.authorCatthoor, F.en
dc.contributor.authorNicopoulos, Chrysostomos A.en
dc.contributor.authorSoudris, D.en
dc.creatorRodopoulos, D.en
dc.creatorSazeides, Y.en
dc.creatorCatthoor, F.en
dc.creatorNicopoulos, Chrysostomos A.en
dc.creatorSoudris, D.en
dc.date.accessioned2019-04-08T07:48:10Z
dc.date.available2019-04-08T07:48:10Z
dc.date.issued2015
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/44799
dc.source11th Workshop on Silicon Errors in Logic – System Effects (SELSE)en
dc.titleSensitivity of SRAM Cell Most Probable SNM Failure Point to Time-Dependent Variabilityen
dc.typeinfo:eu-repo/semantics/conferenceObject
dc.author.facultyΠολυτεχνική Σχολή / Faculty of Engineering
dc.author.departmentΤμήμα Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών / Department of Electrical and Computer Engineering
dc.type.uhtypeConference Objecten
dc.contributor.orcidNicopoulos, Chrysostomos [0000-0001-6389-6068]
dc.gnosis.orcid0000-0001-6389-6068


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