dc.contributor.author | Mihailescu, C. N. | en |
dc.contributor.author | Pasuk, I. | en |
dc.contributor.author | Athanasopoulos, G. I. | en |
dc.contributor.author | Luculescu, C. | en |
dc.contributor.author | Socol, M. | en |
dc.contributor.author | Saint-Martin, R. | en |
dc.contributor.author | Revcolevschi, A. | en |
dc.contributor.author | Giapintzakis, John | en |
dc.creator | Mihailescu, C. N. | en |
dc.creator | Pasuk, I. | en |
dc.creator | Athanasopoulos, G. I. | en |
dc.creator | Luculescu, C. | en |
dc.creator | Socol, M. | en |
dc.creator | Saint-Martin, R. | en |
dc.creator | Revcolevschi, A. | en |
dc.creator | Giapintzakis, John | en |
dc.date.accessioned | 2019-05-06T12:24:09Z | |
dc.date.available | 2019-05-06T12:24:09Z | |
dc.date.issued | 2013 | |
dc.identifier.uri | http://gnosis.library.ucy.ac.cy/handle/7/48630 | |
dc.description.abstract | Epitaxial SrCuO2 thin films were grown on (0 0 1) SrTiO 3 substrates by pulsed laser deposition using a stoichiometric target. X-ray diffraction indicated that the SrCuO2 films undergo a structural phase transition as a function of the substrate temperature. Films deposited at temperatures below 600 °C exhibit a tetragonal phase with the c-axis oriented along the growth direction while films deposited at temperatures above 700 °C exhibit an orthorhombic phase with the b-axis oriented along the growth direction. Atomic force microscopy indicated that the as-grown film surfaces are rather smooth and the roughness increases with increasing substrate temperature. Energy dispersive X-ray spectroscopy in agreement with X-ray diffraction intensity ratio data revealed that all films are non-stoichiometric and contain Sr vacancies (Sr/Cu ∼ 0.8). The influence of film-substrate lattice matching and substrate temperature on the structural phase transition is discussed. © 2012 Elsevier B.V. | en |
dc.language.iso | eng | en |
dc.source | Applied Surface Science | en |
dc.subject | Atomic force microscopy | en |
dc.subject | Pulsed laser deposition | en |
dc.subject | Thin films | en |
dc.subject | X ray diffraction | en |
dc.subject | Substrates | en |
dc.subject | Energy dispersive X ray spectroscopy | en |
dc.subject | X ray spectroscopy | en |
dc.subject | Phase transitions | en |
dc.subject | Structural characterization | en |
dc.subject | Deposits | en |
dc.subject | Diffraction intensity | en |
dc.subject | Epitaxial growth | en |
dc.subject | Non-stoichiometric | en |
dc.subject | Orthorhombic phase | en |
dc.subject | Phase transition | en |
dc.subject | SrCuO<sub>2</sub> | en |
dc.subject | SrCuO2 | en |
dc.subject | Structural high-pressure materials | en |
dc.subject | Structural phase transition | en |
dc.subject | Substrate temperature | en |
dc.title | Growth and structural characterization of orthorhombic and tetragonal SrCuO2 thin films | en |
dc.type | info:eu-repo/semantics/article | |
dc.identifier.doi | 10.1016/j.apsusc.2012.12.029 | |
dc.description.volume | 278 | |
dc.description.startingpage | 132 | |
dc.description.endingpage | 135 | |
dc.author.faculty | Πολυτεχνική Σχολή / Faculty of Engineering | |
dc.author.department | Τμήμα Μηχανικών Μηχανολογίας και Κατασκευαστικής / Department of Mechanical and Manufacturing Engineering | |
dc.type.uhtype | Article | en |
dc.contributor.orcid | Giapintzakis, John [0000-0002-7277-2662] | |
dc.description.totalnumpages | 132-135 | |
dc.gnosis.orcid | 0000-0002-7277-2662 | |