| dc.contributor.author | Othonos, A. | en |
| dc.contributor.author | Zervos, Matthew | en |
| dc.creator | Othonos, A. | en |
| dc.creator | Zervos, Matthew | en |
| dc.date.accessioned | 2019-05-06T12:24:14Z | |
| dc.date.available | 2019-05-06T12:24:14Z | |
| dc.date.issued | 2011 | |
| dc.identifier.uri | http://gnosis.library.ucy.ac.cy/handle/7/48667 | |
| dc.description.abstract | Ultrafast hole carrier relaxation dynamics in CuO nanowires have been investigated using transient absorption spectroscopy. Following femtosecond pulse excitation in a non-collinear pump-probe configuration, a combination of non-degenerate transmission and reflection measurements reveal initial ultrafast state filling dynamics independent of the probing photon energy. This behavior is attributed to the occupation of states by photo-generated carriers in the intrinsic hole region of the p-type CuO nanowires located near the top of the valence band. Intensity measurements indicate an upper fluence threshold of 40 μJ/cm 2 where carrier relaxation is mainly governed by the hole dynamics. The fast relaxation of the photo-generated carriers was determined to follow a double exponential decay with time constants of 0.4 ps and 2.1 ps. Furthermore, time-correlated single photon counting measurements provide evidence of three exponential relaxation channels on the nanosecond timescale. © 2011 Othonos and Zervos | en |
| dc.description.abstract | licensee Springer. | en |
| dc.language.iso | eng | en |
| dc.source | Nanoscale Research Letters | en |
| dc.subject | Dynamics | en |
| dc.subject | Nanowires | en |
| dc.subject | Time-scales | en |
| dc.subject | Electromagnetic pulse | en |
| dc.subject | Femtosecond pulse excitation | en |
| dc.subject | Optical pumping | en |
| dc.subject | Transient absorption spectroscopies | en |
| dc.subject | Carrier dynamics | en |
| dc.subject | Carrier relaxation | en |
| dc.subject | Cuo nanowires | en |
| dc.subject | Excited states | en |
| dc.subject | Exponential decays | en |
| dc.subject | Exponential relaxation | en |
| dc.subject | Fast relaxation | en |
| dc.subject | Fluence thresholds | en |
| dc.subject | Hole carriers | en |
| dc.subject | Hole dynamics | en |
| dc.subject | Intensity measurements | en |
| dc.subject | P-type | en |
| dc.subject | Photogenerated carriers | en |
| dc.subject | Photon energy | en |
| dc.subject | Photons | en |
| dc.subject | Probes | en |
| dc.subject | Pump-probe configuration | en |
| dc.subject | Pump-probe spectroscopy | en |
| dc.subject | Reflection measurements | en |
| dc.subject | Relaxation processes | en |
| dc.subject | State-filling | en |
| dc.subject | Time constants | en |
| dc.subject | Time-correlated single photon counting | en |
| dc.subject | Ultra-fast | en |
| dc.title | Ultrafast hole carrier relaxation dynamics in p-type CuO nanowires | en |
| dc.type | info:eu-repo/semantics/article | |
| dc.identifier.doi | 10.1186/1556-276X-6-622 | |
| dc.description.volume | 6 | |
| dc.description.startingpage | 1 | |
| dc.description.endingpage | 5 | |
| dc.author.faculty | Πολυτεχνική Σχολή / Faculty of Engineering | |
| dc.author.department | Τμήμα Μηχανικών Μηχανολογίας και Κατασκευαστικής / Department of Mechanical and Manufacturing Engineering | |
| dc.type.uhtype | Article | en |
| dc.contributor.orcid | Zervos, Matthew [0000-0002-6321-233X] | |
| dc.description.totalnumpages | 1-5 | |
| dc.gnosis.orcid | 0000-0002-6321-233X | |
