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Carrier mapping in thermoelectric materials

dc.contributor.authorPolymeris, G. S.en
dc.contributor.authorHatzikraniotis, E.en
dc.contributor.authorStefanaki, E. C.en
dc.contributor.authorPavlidou, E.en
dc.contributor.authorKyratsi, Theodoraen
dc.contributor.authorParaskevopoulos, K. M.en
dc.contributor.authorKanatzidis, M. G.en
dc.creatorPolymeris, G. S.en
dc.creatorHatzikraniotis, E.en
dc.creatorStefanaki, E. C.en
dc.creatorPavlidou, E.en
dc.creatorKyratsi, Theodoraen
dc.creatorParaskevopoulos, K. M.en
dc.creatorKanatzidis, M. G.en
dc.date.accessioned2019-05-06T12:24:23Z
dc.date.available2019-05-06T12:24:23Z
dc.date.issued2013
dc.identifier.isbn978-1-60511-520-7
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/48737
dc.description.abstractThe application of micro-fourier transform infrared (FT1R) mapping analysis to thermoelectric materials towards identification of doping inhomogeneities is described. Micro-FTIR, in conjunction with fitting, is used as analytical tool for probing carrier content gradients. The plasmon frequency ωp 2 was studied as potential effective probe for carrier inhomogeneity and consequently doping differentiation based on its dependence of the carrier concentration. The method was applied to PbTe-, PbSe- and Mg2Si- based thermoelectric materials. © 2013 Materials Research Society.en
dc.language.isoengen
dc.publisherAffiliation: Physics Department, Aristotle University of Thessaloniki, GR- 54124, Thessaloniki, Greeceen
dc.publisherAffiliation: Department of Mechanical and Manufacturing Engineering, University of Cyprus, 1678 Nicosia, Cyprusen
dc.publisherAffiliation: Department of Chemistry, Northwestern University, 2145 North Sheridan Road, Evanston, IL 60208, United Statesen
dc.publisherCorrespondence Address: Physics Department, Aristotle University of Thessaloniki, GR- 54124, Thessaloniki, Greeceen
dc.sourceMaterials Research Society Symposium Proceedingsen
dc.subjectInhomogeneitiesen
dc.subjectThermoelectricityen
dc.subjectPbTeen
dc.subjectThermo-Electric materialsen
dc.subjectThermoelectric equipmenten
dc.subjectAnalytical toolen
dc.subjectMapping analysisen
dc.subjectMicro-FTIRen
dc.subjectPlasmon frequencyen
dc.titleCarrier mapping in thermoelectric materialsen
dc.typeinfo:eu-repo/semantics/conferenceObject
dc.identifier.doi10.1557/opl.2013.939
dc.description.volume1543
dc.description.startingpage171
dc.description.endingpage176
dc.author.facultyΠολυτεχνική Σχολή / Faculty of Engineering
dc.author.departmentΤμήμα Μηχανικών Μηχανολογίας και Κατασκευαστικής / Department of Mechanical and Manufacturing Engineering
dc.type.uhtypeConference Objecten
dc.contributor.orcidKyratsi, Theodora [0000-0003-2916-1708]
dc.description.totalnumpages171-176
dc.gnosis.orcid0000-0003-2916-1708


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