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dc.contributor.authorPolymeris, G. S.en
dc.contributor.authorHatzikraniotis, E.en
dc.contributor.authorStefanaki, E. C.en
dc.contributor.authorPavlidou, E.en
dc.contributor.authorKyratsi, Theodoraen
dc.contributor.authorParaskevopoulos, K. M.en
dc.contributor.authorKanatzidis, M. G.en
dc.creatorPolymeris, G. S.en
dc.creatorHatzikraniotis, E.en
dc.creatorStefanaki, E. C.en
dc.creatorPavlidou, E.en
dc.creatorKyratsi, Theodoraen
dc.creatorParaskevopoulos, K. M.en
dc.creatorKanatzidis, M. G.en
dc.date.accessioned2019-05-06T12:24:23Z
dc.date.available2019-05-06T12:24:23Z
dc.date.issued2013
dc.identifier.isbn978-1-60511-520-7
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/48737
dc.description.abstractThe application of micro-fourier transform infrared (FT1R) mapping analysis to thermoelectric materials towards identification of doping inhomogeneities is described. Micro-FTIR, in conjunction with fitting, is used as analytical tool for probing carrier content gradients. The plasmon frequency ωp 2 was studied as potential effective probe for carrier inhomogeneity and consequently doping differentiation based on its dependence of the carrier concentration. The method was applied to PbTe-, PbSe- and Mg2Si- based thermoelectric materials. © 2013 Materials Research Society.en
dc.language.isoengen
dc.publisherAffiliation: Physics Department, Aristotle University of Thessaloniki, GR- 54124, Thessaloniki, Greeceen
dc.publisherAffiliation: Department of Mechanical and Manufacturing Engineering, University of Cyprus, 1678 Nicosia, Cyprusen
dc.publisherAffiliation: Department of Chemistry, Northwestern University, 2145 North Sheridan Road, Evanston, IL 60208, United Statesen
dc.publisherCorrespondence Address: Physics Department, Aristotle University of Thessaloniki, GR- 54124, Thessaloniki, Greeceen
dc.sourceMaterials Research Society Symposium Proceedingsen
dc.subjectInhomogeneitiesen
dc.subjectThermoelectricityen
dc.subjectPbTeen
dc.subjectThermo-Electric materialsen
dc.subjectThermoelectric equipmenten
dc.subjectAnalytical toolen
dc.subjectMapping analysisen
dc.subjectMicro-FTIRen
dc.subjectPlasmon frequencyen
dc.titleCarrier mapping in thermoelectric materialsen
dc.typeinfo:eu-repo/semantics/conferenceObject
dc.identifier.doi10.1557/opl.2013.939
dc.description.volume1543
dc.description.startingpage171
dc.description.endingpage176
dc.author.facultyΠολυτεχνική Σχολή / Faculty of Engineering
dc.author.departmentΤμήμα Μηχανικών Μηχανολογίας και Κατασκευαστικής / Department of Mechanical and Manufacturing Engineering
dc.type.uhtypeConference Objecten
dc.contributor.orcidKyratsi, Theodora [0000-0003-2916-1708]
dc.description.totalnumpages171-176


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