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dc.contributor.authorMakrides, Andreasen
dc.contributor.authorKaragrigoriou, Alexen
dc.contributor.authorVonta, Filiaen
dc.creatorMakrides, Andreasen
dc.creatorKaragrigoriou, Alexen
dc.creatorVonta, Filiaen
dc.date.accessioned2019-12-02T10:36:51Z
dc.date.available2019-12-02T10:36:51Z
dc.date.issued2013
dc.identifier.isbn978-1-118-82680-5
dc.identifier.isbn978-1-84821-619-8
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/57254
dc.description.abstractThe maximum entropy principle is a criterion for selecting a priori probabilities. Maximum entropy modeling has been successfully applied to computer vision, spatial physics, natural language processing and many other fields. Goodness-of-fit (gof) tests measure the degree of agreement between the distribution of an observed random sample and a theoretical statistical distribution. This chapter proposes an alternative information measure that generalizes and is designed for gof tests for heavy-tailed distributions. The chapter provides the test statistic and its asymptotic distribution under the null hypothesis. The power of the test together with the size is the key factor in deciding if the increase in the number of classes is useful. The chapter also provides some simulation studies in order to explore the capabilities of the proposed test statistic. It considers various continuous distributions and applies the probability integral transformation. © ISTE Ltd 2014. All rights reserved.en
dc.publisherWiley Blackwellen
dc.sourceStatistical Models and Methods for Reliability and Survival Analysisen
dc.source.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-84926401346&doi=10.1002%2f9781118826805.ch3&partnerID=40&md5=7c3ad15c9f34edaf6923e1dcebd99b9e
dc.subjectSimulation studiesen
dc.subjectHeavy-tailed distributionsen
dc.subjectEntropy-type goodness-of-fit testsen
dc.subjectGoodness-of-fit (gof) testsen
dc.subjectMaximum entropy principleen
dc.titleEntropy-Type Goodness-of-Fit Tests for Heavy-Tailed Distributionsen
dc.typeinfo:eu-repo/semantics/bookChapter
dc.description.startingpage33
dc.description.endingpage44
dc.author.facultyΣχολή Θετικών και Εφαρμοσμένων Επιστημών / Faculty of Pure and Applied Sciences
dc.author.departmentΤμήμα Μαθηματικών και Στατιστικής / Department of Mathematics and Statistics
dc.type.uhtypeBook Chapteren
dc.contributor.orcidKaragrigoriou, Alex [0000-0002-4919-2133]
dc.contributor.orcidVonta, Filia [0000-0002-7897-6797]
dc.gnosis.orcid0000-0002-4919-2133
dc.gnosis.orcid0000-0002-7897-6797


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