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dc.contributor.authorNeumann, M. H.en
dc.contributor.authorPaparoditis Efstathios, E.en
dc.creatorNeumann, M. H.en
dc.creatorPaparoditis Efstathios, E.en
dc.date.accessioned2019-12-02T10:37:07Z
dc.date.available2019-12-02T10:37:07Z
dc.date.issued2008
dc.identifier.issn1350-7265
dc.identifier.urihttp://gnosis.library.ucy.ac.cy/handle/7/57324
dc.description.abstractNew goodness-of-fit tests for Markovian models in time series analysis are developed which are based on the difference between a fully nonparametric estimate of the one-step transition distribution function of the observed process and that of the model class postulated under the null hypothesis. The model specification under the null allows for Markovian models, the transition mechanisms of which depend on an unknown vector of parameters and an unspecified distribution of i.i.d. innovations. Asymptotic properties of the test statistic are derived and the critical values of the test are found using appropriate bootstrap schemes. General properties of the bootstrap for Markovian processes are derived. A new central limit theorem for triangular arrays of weakly dependent random variables is obtained. For the proof of stochastic equicontinuity of multidimensional empirical processes, we use a simple approach based on an anisotropic tiling of the space. The finite-sample behavior of the proposed test is illustrated by some numerical examples and a real-data application is given. © 2008 ISI/BS.en
dc.sourceBernoullien
dc.source.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-41449090422&doi=10.3150%2f07-BEJ6055&partnerID=40&md5=f7776029dfcf3d3e684564dc4a99fbc8
dc.subjectCentral limit theoremen
dc.subjectBootstrapen
dc.subjectGoodness-of-fit testen
dc.subjectAutoregressive processesen
dc.subjectARCH processesen
dc.subjectWeak dependanceen
dc.titleGoodness-of-fit tests for Markovian time series models: Central limit theory and bootstrap approximationsen
dc.typeinfo:eu-repo/semantics/article
dc.identifier.doi10.3150/07-BEJ6055
dc.description.volume14
dc.description.issue1
dc.description.startingpage14
dc.description.endingpage46
dc.author.facultyΣχολή Θετικών και Εφαρμοσμένων Επιστημών / Faculty of Pure and Applied Sciences
dc.author.departmentΤμήμα Μαθηματικών και Στατιστικής / Department of Mathematics and Statistics
dc.type.uhtypeArticleen
dc.description.notes<p>Cited By :15</p>en
dc.source.abbreviationBernoullien
dc.contributor.orcidPaparoditis Efstathios, E. [0000-0003-1958-781X]
dc.gnosis.orcid0000-0003-1958-781X


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